Entrepix Polish Head Tester
Entrepix’s next-gen head testing provides less downtime and major cost savings.
Entrepix designed this customer favorite head tester through years of testing and troubleshooting. It simulates wafer de-chuck and automatically checks the wafer present/absent sensor function.
Wafer size capabilities: 150mm, 200mm, 300mm
Integrates Titan I, Titan II (Profiler), and Countour heads all in one system.
Entrepix’s head tester allows real-time monitoring of “cross-talk” between head chambers and allows users to interrupt testing for faster chamber troubleshooting.
Get better than OEM.
Interested in what the polish head tester by Entrepix can do for you? Tell us about your needs and we’ll get back to you shortly.